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Materials /Materials characterization

Composition & structure

News and Updates

Blog Posts

Close-up shows shiny metal patches with areas of green corrosion and open holes.

Houston, We Have the Engine Remnants: How My Lab Pieced Together a Forgotten Part of an Apollo Rocket

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A small orange is packaged in a plastic container with a lid.

A Polymer Scientist Wrestles — Literally and Figuratively — With the Frustrations of Plastic Packaging

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Diana Ortiz-Montalvo, wearing safety glasses and holding a small circular filter with tweezers, poses with Abigail Lindstrom in the lab.

Microplastics Mystery: Sampling Airborne Microplastics at a Recycling Facility

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Events

Projects and Programs

A Comparison of WD-EPMA Heterogeneity Testing Procedures

Ongoing
X-ray stage mapping (XSM) can be used to determine the extent of heterogeneity on the micron scale though it is more time consuming and not as accurate as the more rigorous NIST random-point (RP) testing procedure. The objective of this work is to demonstrate the advantage of the latter procedure
Interior view of a long, multistory scientific facility filled with large tubular guides, elevated walkways, and electronic instrumentation.

Advanced Materials Characterization

Ongoing
This program seeks to continually enhance the analytical competence of MML and other major operating units at NIST. Furthermore, the program makes available technical capabilities that U.S. industry and government need in their quest to compete on a global scale through improving methods and

Advanced Materials Design: Structural Applications

Ongoing
Designing New High Temperature Co Superalloys In collaboration with the NIST CHiMaD center, an ICME approach in being used to develop new Co superalloys that are strengthened using an ordered FCC (L1 2) phase (similar to the related Ni-based superalloys). The design goals for these alloys include

Publications

Materials Discovery in Combinatorial and High-throughput Synthesis and Processing: A New Frontier for SPM

Author(s)
Boris Slautin, Yungtao Liu, Yu Liu, Reece Emery, Seungbum Hong, Astita Dubey, Vladimir Shvartsman, Doru Lupascu, Sheryl Sanchez, Mahshid Ahmadi, Yunseok Kim, Evgheni Strelcov, Keith Brown, Philip Rack, Sergei Kalinin
For over three decades, scanning probe microscopy (SPM) has been a key method for exploring material structures and functionalities at nanometer and often

Software

DTSA II

NIST DTSA-II

NIST DTSA-II builds on the best available algorithms in the literature to simulate, quantify and plan energy dispersive x-ray analysis measurements.

RMCPROFILE

RMCProfile is a free software package (developed as a collaborative effort between scientists at several institutions including NIST), that can fit

Tools and Instruments

Hysitron PI-85 Picoindentor

Hysitron PI-85 Picoindentor

This in-situ indentation system can be integrated into electron microscopes as well as being run in other unusual setups. With a load capacity of 150 mN, this

Awards

Vivek Prabhu

Vivek M. Prabhu Named APS Fellow

For fundamental insight into the chain conformation, structure, phase separation, and interfaces of polyelectrolytes enabled by light and
Mark Stoudt

Mark Stoudt Named ASM Fellow

For outstanding contributions to the scientific understanding of the structure-property relationships of additively manufactured alloys and
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